Thermal noise, Shot noise, Flicker noise, Hot-electron noise, One-port, Two-port, Probability, Median, Uncertainty classification, Data simulation, Optimization, Hot load, System uncertainty, Noise power, Percent uncertainty, Transducer gain, Reflection coefficient, Noise resistance, Noise conductance, Noise resistance equivalent temperature, Optimal reflection coefficient, Optimum reflection coefficient, Noise figure, Effective noise temperature, Fractional uncertainty, Standard uncertainty, Expanded uncertainty, C-band cold load, Ambient load, Noise parameters, Monte carlo method