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Transmission Electron Microscope, or TEM, is one of the most valuable tools used in materials science today. It is valuable because it allows the observer to study materials at an atomic level. However, TEM needs to use extremely thin samples (< 50 nm) for electron beam transparency. There are various methods such as crushing, ion beam thinning, ultramicrotomy, cryo-ultramicrotomy, etc. used to obtain an adequate sample for TEM analysis. But to produce quality TEM samples is very challenging due to the huge characteristics differences of various materials. This research is an effort to study the effects of cutting parameters via ultra-microtome on TEM sample quality for carbon nanotube (CNT) composite samples. The CNT composite samples of focus are the nanotube yarn composites. Because nanotubes exhibit extreme strength and stiffness, appropriate cutting parameters should be chosen according to the material properties. During sample preparation, the nanotube yarn composite was embedded longitudinally in Armorstar resin and then cut using the microtome. The results showed that the parameters chosen did not lead to obtaining good TEM samples when comparing to the baseline TEM images. This is most likely due to the fact that the experimental sample is a nanotube yarn composite. Each experimental sample cutting block had three very small nanotube yarn composites embedded longitudinally in the Armorstar resin. When cutting the block using the ultra-microtome, only a small part of the nanotube yarn was cut compared to the overall sample surface area. As a result, obtaining a uniformly thin sample becomes challenging due to the cross section of the cutting block may have large property variations. Further study on the cutting block preparation and cutting parameters are needed.